What algorithms are used for computer memory (RAM) tests?

Essentially all memory tests consist of two parts: 1) Writing a pattern and 2) Reading back the pattern and comparing it for errors. Simple patterns include all zeros, all ones, and alternating bits. These are easy to check. read more

Testing a chip or memory card on an external tester is different from testing in-situ. You are essentially looking to trap three sources of error - address line opens and shorts, data line opens and shorts and memory location faults. read more

For walking ones tests you really only need to test one memory location not the whole memory, that can speed it up. A checkerboard, two locations (the goal there to check state changes on the data bus). read more